메뉴 건너뛰기




Volumn 26, Issue 6, 2010, Pages 640-645

Towards ultrahigh resolution EBSD by low accelerating voltage

Author keywords

Electron backscatter diffraction; Low voltage; Resolution; TWIP steel

Indexed keywords

ACCELERATING VOLTAGES; ACCELERATION VOLTAGES; ELECTRON BACK SCATTER DIFFRACTION; LOW ACCELERATING VOLTAGE; LOW VOLTAGES; NANOSCALE MICROSTRUCTURE; SAMPLE PREPARATION; SEM; SPATIAL RESOLUTION; STRAIGHTFORWARD TECHNIQUES; TWIP STEEL; ULTRAHIGH RESOLUTION; WORKING DISTANCES;

EID: 77954185639     PISSN: 02670836     EISSN: 17432847     Source Type: Journal    
DOI: 10.1179/026708309X12506933873828     Document Type: Article
Times cited : (70)

References (16)
  • 1
    • 0031171333 scopus 로고    scopus 로고
    • Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM
    • T. C. Isabell and V. P. Dravid: 'Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM', Ultramicroscopy, 1997, 67, (1-4), 59-68.
    • (1997) Ultramicroscopy , vol.67 , Issue.1-4 , pp. 59-68
    • Isabell, T.C.1    Dravid, V.P.2
  • 2
    • 33845612753 scopus 로고    scopus 로고
    • On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns
    • S. Zaefferer: 'On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns', Ultramicroscopy, 2007, 107, (2-3), 254-266.
    • (2007) Ultramicroscopy , vol.107 , Issue.2-3 , pp. 254-266
    • Zaefferer, S.1
  • 3
    • 0032399736 scopus 로고    scopus 로고
    • Exploring spatial resolution in electron back-scattered diffraction experiments viaMonte Carlo simulation
    • S. X. Ren, E. A. Kenik, K. B. Alexander and A. Goyal: 'Exploring spatial resolution in electron back-scattered diffraction experiments viaMonte Carlo simulation',Microsc.Microanal., 1998, 4, (1), 15-22.
    • (1998) Microsc.Microanal. , vol.4 , Issue.1 , pp. 15-22
    • Ren, S.X.1    Kenik, E.A.2    Alexander, K.B.3    Goyal, A.4
  • 5
    • 3342908959 scopus 로고    scopus 로고
    • Characterisation of fine-scale microstructures by electron backscatter diffraction
    • F. J. Humphreys: 'Characterisation of fine-scale microstructures by electron backscatter diffraction', Scr. Mater., 2004, 51, (8), 771-776.
    • (2004) Scr. Mater. , vol.51 , Issue.8 , pp. 771-776
    • Humphreys, F.J.1
  • 6
    • 77954209976 scopus 로고    scopus 로고
    • Electron back-scattering patterns in a field emission gun scanning electron microscope
    • Toronto, Ont., Canada, August 1978, Microscopical Society of Canada
    • C. J. Harland, J. H. Klein, P. Akhter and J. A. Venables: 'Electron back-scattering patterns in a field emission gun scanning electron microscope', Proc. 9th Int. Cong. on 'Electron microscopy', Toronto, Ont., Canada, August 1978, Microscopical Society of Canada, 564-565.
    • Proc. 9th Int. Cong. on 'Electron Microscopy , pp. 564-565
    • Harland, C.J.1    Klein, J.H.2    Akhter, P.3    Venables, J.A.4
  • 7
    • 0019529896 scopus 로고
    • Accurate microcrystallography at high spatial-resolution using electron backscattering patterns in a field-emission gun scanning electronmicroscope
    • C. J. Harland, P. Akhter and J. A. Venables: 'Accurate microcrystallography at high spatial-resolution using electron backscattering patterns in a field-emission gun scanning electronmicroscope', J. Phys. E, 1981, 14E, (2), 175-182.
    • (1981) J. Phys. e , vol.14 E , Issue.2 , pp. 175-182
    • Harland, C.J.1    Akhter, P.2    Venables, J.A.3
  • 8
    • 33751438187 scopus 로고
    • Microtexture determination by electron back-scatter diffraction
    • D. J. Dingley and V. Randle: 'Microtexture determination by electron back-scatter diffraction', J. Mater. Sci., 1992, 27, (17), 4545-4566.
    • (1992) J. Mater. Sci. , vol.27 , Issue.17 , pp. 4545-4566
    • Dingley, D.J.1    Randle, V.2
  • 9
    • 0031814254 scopus 로고    scopus 로고
    • Measurement of crystal parameters on backscatter Kikuchi diffraction patterns
    • K. Z. Baba-Kishi: 'Measurement of crystal parameters on backscatter Kikuchi diffraction patterns', Scanning, 1998, 20, (2), 117-127.
    • (1998) Scanning , vol.20 , Issue.2 , pp. 117-127
    • Baba-Kishi, K.Z.1
  • 10
    • 0000884540 scopus 로고    scopus 로고
    • Spatial resolution of EBSP using fully automated pattern indexing
    • O. Farstad, K. Johannessen and J. Hjelen: 'Spatial resolution of EBSP using fully automated pattern indexing', Electron Microsc. 1998, 3, 1998, 753-754.
    • (1998) Electron Microsc. , vol.3 , pp. 753-754
    • Farstad, O.1    Johannessen, K.2    Hjelen, J.3
  • 12
    • 1542349278 scopus 로고    scopus 로고
    • Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy
    • D. Dingley: 'Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy', J. Microsc., 2004, 213, 214-224.
    • (2004) J. Microsc. , vol.213 , pp. 214-224
    • Dingley, D.1
  • 13
    • 2942519446 scopus 로고    scopus 로고
    • EBSD measurement of strains in GaAs due to oxidation of buried AlGaAs layers
    • R. R. Keller, A. Roshko, R. H. Geiss, K. A. Bertness and T. P. Quinn: 'EBSD measurement of strains in GaAs due to oxidation of buried AlGaAs layers', Microelectron. Eng., 2004, 75, (1), 96-102.
    • (2004) Microelectron.Eng. , vol.75 , Issue.1 , pp. 96-102
    • Keller, R.R.1    Roshko, A.2    Geiss, R.H.3    Bertness, K.A.4    Quinn, T.P.5
  • 14
    • 0032839620 scopus 로고    scopus 로고
    • High resolution electron backscatter diffraction with a field emission gun scanning electron microscope
    • F. J. Humphreys and I. Brough: 'High resolution electron backscatter diffraction with a field emission gun scanning electron microscope', J. Microsc., 1999, 195, 6-9.
    • (1999) J. Microsc. , vol.195 , pp. 6-9
    • Humphreys, F.J.1    Brough, I.2
  • 15
    • 0032831195 scopus 로고    scopus 로고
    • Electron backscatter diffraction of grain and subgrain structures - Resolution considerations
    • DOI 10.1046/j.1365-2818.1999.00579.x
    • F. J. Humphreys, Y. Huang, I. Brough and C. Harris: 'Electron backscatter diffraction of grain and subgrain structures - resolution considerations', J. Microsc., 1999, 195, 212-216. (Pubitemid 29444732)
    • (1999) Journal of Microscopy , vol.195 , Issue.3 , pp. 212-216
    • Humphreys, F.J.1    Huang, Y.2    Brough, I.3    Harris, C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.