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Volumn 107, Issue 12, 2010, Pages

In situ real-time spectroscopic ellipsometry measurement for the investigation of molecular orientation in organic amorphous multilayer structures

(2) Yokoyama, Daisuke a,b,c Adachi, Chihaya a

a KYUSHU UNIVERSITY (Japan)

b Life BEANS Center Kyushu (Japan)

c YAMAGATA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MULTILAYERS; ELLIPSOMETRIC PARAMETERS; IN-SITU; MOLECULAR SHAPES; MULTILAYER STRUCTURES; OPTICAL AND ELECTRICAL PROPERTIES; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; SIMPLE MODEL; SPECTRAL RANGE; SUBSTRATE TEMPERATURE;

AMORPHOUS FILMS; COMPUTER SIMULATION; ELECTRIC PROPERTIES; MULTILAYERS; OPTICAL FILMS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY;

MOLECULAR ORIENTATION;

EID: 77954184693 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3432568 Document Type: Article

Times cited : (57)

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