Anisotropic optical properties and molecular orientation in vacuum-deposited ter(9,9-diarylfluorene)s thin films using spectroscopic ellipsometry

Journal of Applied Physics

Volumn 95, Issue 3, 2004, Pages 881-886

  Lin, Hao Wu ^a   Lin, Chun Liang ^a   Chang, Hsin Hua ^a,b   Lin, Yu Ting ^a   Wu, Chung Chih ^a   Chen, You Ming ^a   Chen, Ruei Tang ^a   Chien, Yuh Yih ^a   Wong, Ken Tsung ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b VAN NUNG INSTITUTE OF TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; DEPOSITION; ELLIPSOMETRY; MOLECULAR ORIENTATION; OPTICAL PROPERTIES; THIN FILMS; VACUUM APPLICATIONS;

SPECTROSCOPIC ELLIPSOMETRY; VACUUM DEPOSITED THIN FILMS;

FLUORINE CONTAINING POLYMERS;

EID: 1142268152     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1635991     Document Type: Article

References (64)

1. L. S. Hung and C. H. Chen, Mater. Sci. Eng., R. 39, 143 (2002).
2. A. Kraft, A. C. Grimsdale, and A. B. Holmes, Angew. Chem., Int. Ed. Engl. 37, 402 (1998).
3. N. Tessler, G. J. Denton, and R. H. Friend, Nature (London) 382, 695 (1996).
4. C. W. Tang and S. A. VanSlyke, Appl. Phys. Lett. 51, 913 (1987).
5. C. W. Tang, S. A. VanSlyke, and C. H. Chen, J. Appl. Phys. 65, 3610 (1989).
6. C. H. Chen, J. Shi, and C. W. Tang, Macromol. Symp. 125, 1 (1997).
7. J. H. Burroughes, D. D. C. Bradley, A. R. Brown, R. N. Marks, Mackay, R. H. Friend, P. L. Burns, and A. B. Holmes, Nature (London) 347, 539 (1990).
8. G. Horowitz, Adv. Mater. 10, 365 (1998).
9. H. Bleir, in Organic Materials for Photonics, edited by G. Zerbi (Elsevier, Amsterdam, 1993), p. 77
10. S. R. Marder, B. Kippelen, A. K. Y. Jen, and N. Peyghambarian, Nature (London) 388, 845 (1997).
11. M. D. McGehee, R. Gupta, S. Veenstra, E. K. Miller, M. A. Dìaz-Garcìa, and A. J. Heeger, Phys. Rev. B 58, 7035 (1998).
12. S. V. Frolov, Z. V. Vardeny, and K. Yoshino, Phys. Rev. B 57, 9141 (1998).
13. S. V. Frolov, Z. V. Vardeny, and K. Yoshino, Appl. Phys. Lett. 72, 1802 (1998).
14. V. G. Kozlov, G. Parthasarathy, P. E. Burrows, S. R. Forrest, Y. You, and M. E. Thompson, Appl. Phys. Lett. 72, 144 (1998).
15. S. V. Frolov, M. Shkunov, Z. V. Vardeny, and K. Yoshino, Phys. Rev. B 56, R4363 (1997).
16. F. Hide, M. A. Dìaz-Garcìa, B. J. Schwartz, and A. J. Heeger, Acc. Chem. Res. 30, 430 (1997).
17. V. G. Kozlov, V. Bulovic, and S. R. Forrest, Appl. Phys. Lett. 71, 2575 (1997).
18. C. Zenz, W. Graupner, S. Tasch, G. Leising, K. Müllen, and U. Sherf, Appl. Phys. Lett. 71, 2566 (1997).
19. V. G. Kozlov, V. Bulovic, P. E. Burrows, and S. R. Forrest, Nature (London) 389, 363 (1997).
20. N. Tessler, G. J. Denton, and R. H. Friend, Nature (London) 382, 695 (1996).
21. E. K. Miller, M. D. McGehee, M. Diaz-Garcia, V. Srikant, and A. J. Heeger, Synth. Met. 102, 1091 (1999).
22. N. C. Greenham, R. H. Friend, and D. D. C. Bradley, Adv. Mater. (Weinheim, Ger.) 6, 491 (1994).
23. H. F. Wittmann, J. Grüner, R. H. Friend, G. W. C. Spencer, S. C. Moratti, and A. B. Holmes, Adv. Mater. (Weinheim, Ger.) 7, 541 (1995).
24. W. M. V. Wan, N. C. Greenham, and R. H. Friend, J. Appl. Phys. 87, 2542 (2000).
25. A. Boudrioua, P. A. Hobson, B. Matterson, I. D. W. Samuel, and W. L. Barnes, Synth. Met. 111-112, 545 (2000).
26. M. Tammer, R. W. T. Higgins, and A. P. Monkman, J. Appl. Phys. 91, 4010 (2002).
27. J. Sturm et al., Thin Solid Films 298, 138 (1997).
28. L. A. A. Pettersson, T. Johansson, F. Carlsson, H. Arwin, and O. Inganäs, Synth. Met. 101, 198 (1999).
29. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
30. M. Tammer and A. P. Monkman, Adv. Mater. (Weinheim, Ger.) 14, 210 (2002).
31. M. Friedrich, T. Wagner, G. Savlvan, S. Park, T. U. Kampen, and D. R. T. Zahn, Appl. Phys. A: Mater. Sci. Process. 75, 501 (2002).
32. Y. Geng, A. Trajkovska, D. Katsis, J. J. Ou, S. W. Culligan, and S. H. Chen, J. Am. Chem. Soc. 124, 8337 (2002).
33. Y. Geng, S. W. Culligan, A. Trajkovska, J. U. Wallace, and S. H. Chen, Chem. Mater. 15, 542 (2003).
34. D. Oelkrug, H. J. Egelhaaf, and J. Haiber, Thin Solid Films 284-285, 267 (1996).
35. H. J. Egelhaaf, J. Gierschner, and D. Oelkrug, Synth. Met. 83, 221 (1996).
36. H. J. Egelhaaf, J. Gierschner, J. Haiber, and D. Oelkrug, Opt. Mater. (Amsterdam, Neth.) 12, 395 (1999).
37. M. K. Debe, J. Vac. Sci. Technol. A 10, 2816 (1992).
38. M. Fukuda, K. Sawada, and K. Yoshino, J. Polym. Sci., Part A: Polym. Chem. 31, 2465 (1993).
39. Q. B. Pei and Y. Yang, J. Am. Chem. Soc. 118, 7416 (1996).
40. M. T. Bernius, M. Inbasekaran, J. O'Brien, and W. S. Wu, Adv. Mater. (Weinheim, Ger.) 12, 1737 (2000).
41. M. Belletête, M. Ranger, S. Beaupré, M. Leclerc, and G. Durocher, Chem. Phys. Lett. 316, 101 (2000).
42. M. Redecker, D. D. C. Bradley, M. Inbasekaran, and E. P. Woo, Appl. Phys. Lett. 73, 1565 (1998).
43. M. Grell, D. D. C. Bradley, M. Inbasekaran, and E. P. Woo, Adv. Mater. (Weinheim, Ger.) 9, 798 (1997).
44. S. Setayesh, A. C. Grimsdale, T. Weil, V. Enkelmann, K. Müllen, F. Meghdadi, E. J. W. List, and G. Leising, J. Am. Chem. Soc. 123, 946 (2001).
45. U. Scherf, and E. J. W. List, Adv. Mater. (Weinheim, Ger.) 14, 477 (1997).
46. K.-H. Weinfurtner, F. Weissörtel, G. Harmgarth, and J. Salbeck, Proc. SPIE 3476, 40 (1998).
47. D. Katsis, Y. H. Geng, J. J. Ou, S. W. Culligan, A. Trajkovska, S. H. Chen, and L. J. Rothberg, Chem. Mater. 14, 1332 (2002).
48. Y. Geng, D. Katsis, S. W. Culligan, J. J. Ou, S. H. Chen, and L. J. Rothberg, Chem. Mater. 14, 463 (2002).
49. K.-T. Wong et al., J. Am. Chem. Soc. 124, 11576 (2002).
50. C.-C. Wu, T.-L. Liu, W.-Y. Hung, Y.-T. Lin, K.-T. Wong, R.-T. Chen, Y.-M. Chen, and Y.-Y. Chien, J. Am. Chem. Soc. 125, 3710 (2003).
51. E. K. Miller, G. S. Maskel, C. Y. Yang, and A. J. Heeger, Phys. Rev. B 60, 8028 (1999).
52. M. Grell, W. Knoll, D. Lupo, A. Meisel, T. Miteva, D. Neher, H.-G. Nothofer, U. Scherf, and A. Yasuka, Adv. Mater. (Weinheim, Ger.) 11, 671 (1999).
53. H. G. Tompkins, and W. A. McGahan, Spectroscopic Ellipsometry and Reflectometry (Wiley, New York, 1999).
54. G. E. Jellison, Thin Solid Films 313-314, 33 (1998).
55. C. M. Ramsdale and N. C. Greenham, Adv. Mater. (Weinheim, Ger.) 14, 212 (2002).
56. R. Anémian, J.-C. Mulatier, C. Andraud, O. Stéphan, and J.-C. Vial, Chem. Commun. (Cambridge) 2002, 2608 (2002).
57. J. Salbeck, N. Yu, J. Bauer, F. Weissörtel, and H. Bestgen, Synth. Met. 91, 209 (1997).
58. N. Johansson et al., J. Chem. Phys. 107, 2542 (1997).
59. C.-C. Wu et al., Appl. Phys. Lett. 81, 577 (2002).
60. M. R. Robison, S. Wang, G. C. Bazan, and Y. Cao, Adv. Mater. (Weinheim, Ger.) 12, 1701 (2000).
61. M. Born and E. Wolf, Principles of Optics, 6th ed. (Cambridge University Press Cambridge, 1980).
62. I. C. Khoo and S. T. Wu, Optics and Nonlinear Optics of Liquid Crystals (World Scientific, Singapore, 1993).
63. W. Maier and A. Saupe, Z. Naturforsch. A 13A, 564 (1958).
64. J. B. Birk, Photophysics of Aromatic Molecules (Wiley, New York, 1970).