In situ and ex situ optical characterization of electro deposited magneto-optic materials

Journal of Applied Physics

Volumn 79, Issue 8 PART 2B, 1996, Pages 6193-6195

  Hilfiker, James N ^a   Glenn, Darin W ^a   Heckens, Scott ^a   Woollam, John A ^a   Wierman, Kurt W ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; ELECTRODEPOSITION; ELLIPSOMETRY; FILM GROWTH; MATHEMATICAL MODELS; MICROSTRUCTURE; NICKEL ALLOYS; OPTICAL PROPERTIES; SURFACE ROUGHNESS; THIN FILMS;

FILM THICKNESS; MAGNETOOPTICAL MATERIALS; OPTICAL CONSTANTS; SPECTROSCOPIC ELLIPSOMETRY;

MAGNETIC MATERIALS;

EID: 0030128195     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362069     Document Type: Article

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