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Advanced Materials Research

Volumn 105-106, Issue 1, 2010, Pages 282-285

Electrical properties of bismuth-layered structural CaxSr 2-xBi4Ti5O18 ceramics

(6) Fan, S H a Zhang, F Q a Che, Q D a Yu, R a Hu, W a Tian, Q B a

a SHANDONG JIANZHU UNIVERSITY (China)

Author keywords

CaxSr2 xBi4Ti5O18; Ferroelectric ceramics; Remnant polarization

Indexed keywords

COERCIVE FIELD; DIELECTRIC CONSTANTS; ELECTRICAL PROPERTY; FERROELECTRIC PROPERTY; LAYERED PEROVSKITE; REMNANT POLARIZATIONS; SECONDARY PHASE;

BISMUTH; CALCIUM; CRYSTAL MICROSTRUCTURE; DIELECTRIC DEVICES; DIELECTRIC LOSSES; ELECTRIC PROPERTIES; FERROELECTRICITY; OXIDE MINERALS; PERMITTIVITY; PEROVSKITE; POLARIZATION;

FERROELECTRIC CERAMICS;

EID: 77954183617 PISSN: 10226680 EISSN: None Source Type: Book Series
DOI: 10.4028/www.scientific.net/AMR.105-106.282 Document Type: Conference Paper

Times cited : (3)

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