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Volumn 47, Issue 6, 2001, Pages 334-338
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SrBi4Ti4O15 thin films of Ti containing bismuth-layered-ferroelectrics prepared by pulsed laser deposition
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COERCIVE FORCE;
DEPOSITION;
ELECTROMAGNETIC WAVE POLARIZATION;
FERROELECTRIC MATERIALS;
GRAIN SIZE AND SHAPE;
MAGNETIC HYSTERESIS;
PULSED LASER APPLICATIONS;
REMANENCE;
SCANNING ELECTRON MICROSCOPY;
STRONTIUM COMPOUNDS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
AURIVILLIUS PHASES;
FERROELECTRIC THIN FILMS;
PULSED LASER DEPOSITION;
DIELECTRIC FILMS;
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EID: 0034831878
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-577X(00)00260-3 Document Type: Article |
Times cited : (34)
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References (20)
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