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Volumn 81, Issue 21, 2002, Pages 4052-4054
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High remanent polarization in Sr1-xCaxBi2Ta2O9 ferroelectric thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC WAVE DIFFRACTION;
ELECTROMAGNETIC WAVE POLARIZATION;
FERROELECTRICITY;
PERMITTIVITY;
SILICON;
STRONTIUM COMPOUNDS;
HIGH REMANENT POLARIZATION;
FERROELECTRIC THIN FILMS;
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EID: 0037132218
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1523154 Document Type: Article |
Times cited : (26)
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References (17)
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