Electrical properties of neodymium doped CaBi4Ti 4O15 ceramics

Solid State Communications

Volumn 133, Issue 9, 2005, Pages 553-557

  Zeng, Jiangtao ^a,b   Li, Yongxiang ^a   Wang, Dong ^a   Yin, Qingrui ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

A. Aurivillius oxide; A. Ferroelectrics; D. Dielectric response; D. Piezoelectricity

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; NEODYMIUM; PIEZOELECTRICITY; RANDOM ACCESS STORAGE; SEMICONDUCTOR DOPING; X RAY DIFFRACTION ANALYSIS;

AURIVILLUIS OXIDES; BISMUTH LAYER STRUCTURE FERROELECTRICS (BLSF); DIELECTRIC RESPONSE; SINTERED CERAMICS;

CERAMIC MATERIALS;

EID: 13444309177     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.12.043     Document Type: Article

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