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Volumn 92, Issue 10, 2008, Pages

Real-time thermal imaging of catastrophic optical damage in red-emitting high-power diode lasers

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CONTINUOUS WAVE LASERS; INFRARED IMAGING; LIGHT EMISSION; TEMPERATURE MEASUREMENT;

EID: 40849141087     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2898202     Document Type: Article
Times cited : (32)

References (12)
  • 1
    • 36449002501 scopus 로고
    • APPLAB 0003-6951 10.1063/1.109469.
    • H. Fujii, Y. Ueno, and K. Endo, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.109469 62, 2114 (1993).
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 2114
    • Fujii, H.1    Ueno, Y.2    Endo, K.3
  • 6
    • 0027812558 scopus 로고
    • JAPNDE 0021-4922 10.1143/JJAP.32.5514.
    • P. W. Epperlein, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 10.1143/JJAP.32.5514 32, 5514 (1993).
    • (1993) Jpn. J. Appl. Phys., Part 1 , vol.32 , pp. 5514
    • Epperlein, P.W.1
  • 7
    • 0016102063 scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1663885.
    • B. W. Hakki and F. R. Nash, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1663885 45, 3907 (1974).
    • (1974) J. Appl. Phys. , vol.45 , pp. 3907
    • Hakki, B.W.1    Nash, F.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.