X-ray reflectivity theory for determining the density profile of a liquid under nanometre confinement

Journal of Synchrotron Radiation

Volumn 17, Issue 4, 2010, Pages 465-472

  Perret, Edith ^a   Nygård, Kim ^a   Satapathy, Dillip K ^b   Balmer, Tobias E ^c   Bunk, Oliver ^a   Heuberger, Manfred ^d   Van Der Veen, J Friso ^a,c  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF FRIBOURG   (Switzerland)

^c ETH ZURICH   (Switzerland)

^d SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

confined fluids; X ray reflectivity

Indexed keywords

CONFINED FLUIDS; CONFINED LIQUIDS; CRYSTAL PLANES; DENSITY PROFILE; HIGHLY SENSITIVE; IN-BETWEEN; MICA SURFACES; MOLECULAR LIQUIDS; NANOMETRES; STRUCTURE FACTORS; TETRAKIS; THIN LIQUID FILM; TRIMETHYL; VARIABLE THICKNESS; X RAY REFLECTIVITY; X-RAY INTERFEROMETERS;

CRYSTAL STRUCTURE; FLUIDS; LIQUID FILMS; MICA; REFLECTION; SILICATE MINERALS; X RAYS;

DENSITY OF LIQUIDS;

EID: 77954038549     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049510014858     Document Type: Article

References (26)

1. Born, M. & Wolf, E. (1980). Principles of Optics. Oxford: Pergamon Press.
2. Clarkson, M. T. (1989). J. Phys. D, 22, 475-482.
3. Fenter, P. A. (2002). Rev. Mineral. Geochem. 49, 149-221.
4. Gao, J. P., Luedtke, W. D. & Landman, U. (1997). J. Phys. Chem. B, 101, 4013-4023.
5. Güven, N. (1971). Z. Kristallogr. 134, 196-212.
6. Heuberger, M. (2001). Rev. Sci. Instrum. 72, 1700.
7. Heuberger, M., Vanicek, J. & Zäch, M. (2001). Rev. Sci. Instrum. 72, 3556.
8. Hirano, T., Usami, K., Ueda, K. & Hoshiya, H. (1998). J. Synchrotron Rad. 5, 969-971.
9. Huisman, W. J. & van der Veen, J. F. (1998). Surface Sci. 404, 866-870.
10. Israelachvili, J. (1971). Nat. Phys. Sci. 229, 85-86.
11. Israelachvili, J. (1973). J. Colloid Interface Sci. 44, 259-272.
12. Israelachvili, J. N. & McGuiggan, P. M. (1990). J. Mater. Res. 5, 2223-2231.
13. Kjellander, R. & Sarman, S. (1991). J. Chem. Soc. Faraday Trans. 87, 1869-1881.
14. Kraft, P., Bergamaschi, A., Broennimann, Ch., Dinapoli, R., Eikenberry, E. F., Henrich, B., Johnson, I., Mozzanica, A., Schlepütz, C. M., Willmott, P. R. & Schmitt, B. (2009). J. Synchrotron Rad. 16, 368-375.
15. Perret, E., Nyga°rd, K., Satapathy, D. K., Balmer, T. E., Bunk, O., Heuberger, M. & van der Veen, J. F. (2009). Europhys. Lett. 88, 36004.
16. Persson, B. N. J. & Tosatti, E. (1994). Phys. Rev. B, 50, 5590-5599.
17. Reichert, H., Klein, O., Dosch, H., Denk, M., Honkimäki, V., Lippmann, T. & Reiter, G. (2000). Nature (London), 408, 839-841.
18. Robinson, I. K. (1986). Phys. Rev. B, 33, 3830-3836.
19. Schlegel, M. L., Nagy, K. L., Fenter, P., Cheng, L., Sturchio, N. C. & Jacobsen, S. D. (2006). Geochim. Cosmochim. Acta, 70, 3549-3565.
20. Schoen, M. & Dietrich, S. (1997). Phys. Rev. E, 56, 499-510.
21. Seeck, O. H., Kim, H., Lee, D. R., Shu, D., Kaendler, I. D., Basu, J. K. & Sinha, S. K. (2002). Europhys. Lett. 60, 376-382.
22. Seltzer, S. M. (1993). Radiat. Res. 136, 147-170.
23. Torrelles, X. & Rius, J. (2004). J. Appl. Cryst. 37, 395-398.
24. Vlieg, E. (1997). J. Appl. Cryst. 30, 532-543.
25. Yu, C. J., Richter, A. G., Datta, A., Durbin, M. K. & Dutta, P. (1999). Phys. Rev. Lett. 82, 2326-2329.
26. Yu, C. J., Richter, A. G., Kmetko, J., Datta, A. & Dutta, P. (2000). Europhys. Lett. 50, 487-493.