Observation of thickness quantization in liquid films confined to molecular dimension

Europhysics Letters

Volumn 60, Issue 3, 2002, Pages 376-382

  Seeck, O H ^a,b   Kim, Hyunjung ^b,c   Lee, D R ^b   Shu, D ^b   Kaendler, I D ^b   Basu, J K ^d   Sinha, S K ^b,c  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036851030     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2002-00274-6     Document Type: Article

References (15)

1. Van Alsten J. and Granick S., Phys. Rev. Lett., 61 (1988) 2570.
2. Magnussen O.M., Ocko B.M., Regan M.J., Penanen K., Pershan P.S. and Deutsch M., Phys. Rev. Lett., 74 (1995) 4444.
3. Tolan M., Seeck O.H., Schlomka J.-P., Press W., Wang J., Sinha S.K., Li Z., Rafailovich M.H. and Sokolov J., Phys. Rev. Lett., 81 (1998) 2731.
4. Huisman W.J., Peters J.F., Zwanenburg M.J., De Vries S.A., Derry T.E., Aberkathy D. and Van Der Veen J.F., Nature, 390 (1997) 379.
5. Yu C.J., Richter A.G., Datta A., Durbin M.K. and Dutta P., Phys. Rev. Lett., 82 (1999) 2326.
6. Reichert H., Klein O., Dosch H., Denk M., Honkimäki V., Lippmann T. and Reiter G., Nature, 408 (2000) 839.
7. Klein J. and Kumacheva E., J. Chem. Phys., 108 (1998) 696.
8. Israelachvili J.N., McGuiggan P.M. and Homola A.M., Science, 240 (1988) 189.
9. Horn R.G. and Israelachvili J.N., Macromolecules, 21 (1988) 2836.
10. Soga I., Dhinojwala A. and Granick S., Langmuir, 14 (1998) 1156.
11. Zwanenburg M.J., Peters J.F., Bongaerts J.H.H., De Vries S.A., Abernathy D.L. and Van Der Veen J.F., Phys. Rev. Lett., 82 (1999) 1696.
12. Zwanenburg M.J., Bongaerts J.H.H., Peters J.F., De Riese D.O. and Van Der Veen J.F., Phys. Rev. Lett., 85 (2000) 5154.
13. Seeck O.H., Kaendler I.D., Tolan M., Shin K., Rafailovich M.H., Sokolov J. and Kolb R., Appl. Phys. Lett., 76 (2000) 2713.
14. Parratt L.G., Phys. Rev., 95 (1954) 359.
15. Tolan M., X-ray Scattering from Soft Matter Thin Films, Vol. 148 (Springer, Berlin) 1999.