Faster acquisition of structure-factor amplitudes in surface X-ray diffraction experiments

Journal of Applied Crystallography

Volumn 37, Issue 3, 2004, Pages 395-398

  Torrelles, X ^a   Rius, J ^a  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; AMPLITUDE MODULATION; ARTICLE; FILM; GEOMETRY; STRUCTURE ANALYSIS; SURFACE PROPERTY; THEORY; THICKNESS; VALIDATION PROCESS; X RAY DIFFRACTION;

EID: 3442894732     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804005564     Document Type: Article

References (13)

1. Erdman, N., Poeppelmeier, K. R., Asta, M., Warschkow, O., Ellis, D. E. & Marks, L. D. (2002). Nature (London), 419, 55-58.
2. Feidenhans'l, R. (1989). Surf. Sci. Rep. 10, 105-188.
3. Ferrer, S. & Comin, E (1995). Rev. Sci. Instrum. 66, 1674-1676.
4. Hirnet, A., Schroeder, K., Blügel, S., Torrelles, X., Albrecht, M., Jenichen, B., Gierer, M. & Moritz, W. (2002). Phys. Rev. Lett. 88, 226102(1-4).
5. Rius, J., Miravitlles, C. & Allmann, R. (1996). Acta Cryst. A52, 634-639.
6. Robach, O., Garreau, Y., Aïd, K. & Véron-Jolliot, M. B. (2000). J. Appl. Cryst. 33, 1006-1018.
7. Robinson, I. K. & Tweet, D. J. (1992). Rep. Prog. Phys. 55, 599-691.
8. Specht, E. D. & Walker, F. J. (1993). J. Appl. Cryst. 26, 166-171.
9. Tong, S. Y., Huang, H., Wei, C. M., Packard, W. E., Men, F. K., Glander, G. & Webb, M. B. (1988). J. Vac. Sci. Technol A. 6, 615-624.
10. Torrelles, X., Alvarez, J. & Ferrer, S. (1996). Surf. Rev. Lett. 4, 1035-1038.
11. Torrelles, X., Rius, J., Miravitlles, C. & Ferrer, S. (1999). Surf. Sci. 423, 338-345.
12. Vlieg, E. (1997). J. Appl. Cryst. 30, 532-543.
13. Vlieg, E. & Robinson, I. K. (1992). Synchrotron Radiation Crystallography, edited by P. Coppens, pp. 255-299. London: Academic Press.