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Volumn 20, Issue 26, 2010, Pages 5474-5480
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Tuning surface properties in photosensitive polyimide. Material design for high performance organic thin-film transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
AVERAGE FIELD;
DOPING CARRIERS;
ELECTRICAL CHARACTERISTIC;
ELECTROSTATIC FORCE MICROSCOPY;
IRRADIATION DOSE;
MATERIAL DESIGNS;
MICRO RAMAN SPECTROSCOPY;
ORGANIC THIN FILM TRANSISTORS;
PENTACENE FILM;
PENTACENES;
PHOTOSENSITIVE POLYIMIDE;
SILICON DIOXIDE GATES;
SURFACE ENERGIES;
ULTRA-HIGH PERFORMANCE;
UV LIGHT;
CONTACT ANGLE;
DIELECTRIC MATERIALS;
DIELECTRIC PROPERTIES;
ELECTRIC FORCE MICROSCOPY;
ELECTROSTATIC FORCE;
GATE DIELECTRICS;
GATES (TRANSISTOR);
INTERFACIAL ENERGY;
LIGHT SENSITIVE MATERIALS;
PHOTOSENSITIVITY;
POLYIMIDES;
RAMAN SPECTROSCOPY;
SEMICONDUCTING ORGANIC COMPOUNDS;
SILICA;
SURFACE CHEMISTRY;
SURFACE PROPERTIES;
SURFACE TENSION;
X RAY DIFFRACTION;
THIN FILM TRANSISTORS;
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EID: 77953848335
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/c0jm00196a Document Type: Article |
Times cited : (22)
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References (41)
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