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Volumn 412, Issue 1-3, 2005, Pages 50-54
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PALS and SPM/EFM investigation of charged nanoporous electret films
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRETS;
ELECTRIC FIELD EFFECTS;
GLASS TRANSITION;
SCANNING;
SUPERCRITICAL FLUIDS;
X RAY SCATTERING;
ELECTRET MATERIALS;
ELECTRIC FIELD MICROSCOPY;
NANOPOROUS ELECTRET FILMS;
SURFACE CHARGES;
NANOSTRUCTURED MATERIALS;
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EID: 23144441108
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2005.04.118 Document Type: Article |
Times cited : (19)
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References (15)
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