Sensitivity analysis of atomic force microscope cantilever made of functionally graded materials

Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference 2009, DETC2009

Volumn 6, Issue , 2010, Pages 539-544

  Rahaeifard, M ^a   Kahrobaiyan, M H ^a   Ahmadian, M T ^a  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM TIP; ATOMIC FORCE MICROSCOPE CANTILEVERS; BEAM MATERIAL; CERAMIC VOLUME FRACTION; CONTACT STIFFNESS; EULER BERNOULLI BEAM THEORY; HIGH QUALITY; HIGH-CONTRAST IMAGES; LINEAR SPRING; MICRO-CANTILEVERS; MICROCANTILEVER BEAMS; POWER LAW; RESONANT FREQUENCIES; SURFACE CONTACT;

ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; NANOCANTILEVERS; NATURAL FREQUENCIES; SENSITIVITY ANALYSIS; STIFFNESS; TITRATION; VOLUME FRACTION;

FUNCTIONALLY GRADED MATERIALS;

EID: 77953774376     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/DETC2009-86254     Document Type: Conference Paper

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