Effect of interactive damping on sensitivity of vibration modes of rectangular AFM cantilevers

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 312, Issue 3-4, 2003, Pages 158-165

  Chang, Win Jin ^a   Fang, Te Hua ^a   Chou, Huann Ming ^a  

^a NONE

Author keywords

Atomic force microscope; Damping effect; Sensitivity analysis

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS; SENSITIVITY ANALYSIS; STIFFNESS; VIBRATION ANALYSIS;

CLOSED-FORM EXPRESSION; DAMPING COEFFICIENTS; DAMPING EFFECT; FLEXURAL SENSITIVITY; LATERAL CONTACT; MODAL SENSITIVITIES; NORMAL CONTACT STIFFNESS; TORSIONAL VIBRATION;

DAMPING;

ACCURACY; ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; MATHEMATICAL ANALYSIS; PHYSICS; RIGIDITY; VIBRATION;

EID: 0038441490     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0375-9601(03)00620-0     Document Type: Article

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