Bulk ZnO: Current status, challenges, and prospects

Proceedings of the IEEE

Volumn 98, Issue 7, 2010, Pages 1339-1350

  Avrutin, Vitaliy ^a   Cantwell, Gene ^b   Zhang, Jizhi ^b   Song, J J ^b,c   Silversmith, Donald J ^d   Morkoç, Hadis ^a  

^a Virginia Commonwealth University   (United States)

^b ZN Technology Inc   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d AIR FORCE OFFICE OF SCIENTIFIC RESEARCH   (United States)

Author keywords

Bridgman method; Hydrothermal method; Single crystals; Vapor transport; Zinc oxide

Indexed keywords

CRYSTAL GROWTH FROM MELT; MICROELECTRONICS; SINGLE CRYSTALS; THERMAL EXPANSION; ZINC OXIDE;

BRIDGMAN TECHNIQUES; COMMERCIAL VIABILITY; DEVICE APPLICATION; FOREIGN SUBSTRATES; HETEROEPITAXIAL STRUCTURE; HYDROTHERMAL METHODS; THERMAL EXPANSION MISMATCH; VAPOR TRANSPORT;

II-VI SEMICONDUCTORS;

EID: 77953686851     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPROC.2010.2040363     Document Type: Conference Paper

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