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Volumn 96, Issue 23, 2010, Pages

Retardation of electromigration-induced Ni(P) consumption by an electroless Pd insertion layer

Author keywords

[No Author keywords available]

Indexed keywords

BOND PAD; COMPOUND LAYER; ELECTROLESS; EM RESISTANCE; ENHANCED DIFFUSION; HIGH CURRENT DENSITIES; INSERTION LAYERS; SOLDER BUMP;

EID: 77953498006     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3449119     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.