Optically detected cyclotron resonance properties of high purity ZnSe epitaxial layers grown on GaAs

Applied Physics Letters

Volumn 71, Issue 8, 1997, Pages 1116-1117

  Drechsler, M ^a   Meyer, B K ^a   Hofmann, D M ^a   Ruppert, P ^b   Hommel, D ^b  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF BREMEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001025291     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119744     Document Type: Article

References (9)

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