Influences of thickness-uniformity and surface morphology on the electrical and optical properties of sputtered CdTe thin films for large-area II-VI semiconductor heterostructured solar cells

Materials Science and Engineering: B

Volumn 171, Issue 1-3, 2010, Pages 73-78

  Choi, Youn Ok ^a   Kim, Nam Hoon ^b   Park, Ju Sun ^a   Lee, Woo Sun ^a  

^a Chosun University   (South Korea)

^b Chonnam National University   (South Korea)

Author keywords

CdTe thin films; Electrical and optical properties; Sputtering; Surface morphology; Thickness uniformity

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM TELLURIDE; CARRIER CONCENTRATION; COSTS; ENERGY GAP; II-VI SEMICONDUCTORS; LIGHT ABSORPTION; MORPHOLOGY; OPTICAL PROPERTIES; SILICON SOLAR CELLS; SOLAR ENERGY; SOLAR POWER GENERATION; SPUTTERING; THIN FILM SOLAR CELLS; THIN FILMS;

CADMIUM TELLURIDE SOLAR CELLS; CADMIUM TELLURIDE THIN FILMS; CELLS PRODUCTION; ELECTRICAL AND OPTICAL PROPERTIES; PHOTOVOLTAIC PROPERTY; PROCESS CONDITION; PROCESSING CONDITION; SPUTTERING; THICKNESS UNIFORMITY; THIN-FILMS;

SURFACE MORPHOLOGY;

EID: 77953321416     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2010.03.072     Document Type: Article

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