Annealing effect on structural and electrical properties of thermally evaporated Cd1-xMnxS nanocrystalline films

Materials Research Bulletin

Volumn 43, Issue 12, 2008, Pages 3245-3251

  Reddy, D Sreekantha ^a   Rao, K Narasimha ^a   Gunasekhar, K R ^a   Reddy, N Koteeswara ^c   Kumar, K Siva ^b   Reddy, P Sreedhara ^b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b SRI VENKATESWARA UNIVERSITY   (India)

^c Chonbuk National University   (South Korea)

Author keywords

C. Atomic force microscopy; D. Electrical properties

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; MANGANESE; MANGANESE ALLOYS; MANGANESE COMPOUNDS; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; THERMAL EVAPORATION; THICK FILMS; X RAY DIFFRACTION ANALYSIS; ZINC SULFIDE;

ANNEALED FILMS; ANNEALING EFFECTS; ANNEALING TEMPERATURES; ATOMIC FORCES; C. ATOMIC FORCE MICROSCOPY; D. ELECTRICAL PROPERTIES; DISPERSIVE ANALYSES; ELECTRICAL CONDUCTIVITIES; ELECTRICAL PROPERTIES; GLASS SUBSTRATES; GRAIN SIZES; HOST MATERIALS; MN CONTENTS; NANOCRYSTALLINE FILMS; TEMPERATURE RANGES; THIN-FILMS; WURTZITE STRUCTURES; X-RAY DIFFRACTIONS;

CADMIUM;

EID: 54049112601     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2008.02.026     Document Type: Article

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