Structural, photoluminescent and electrical properties of CdTe films with different compositions fabricated by CMBD

Solar Energy

Volumn 83, Issue 1, 2009, Pages 90-93

  Razykov, T M ^a,c   Contreras Puente, G ^b   Chornokur, G C ^c   Dybjec, M ^c   Emirov, Yu ^c   Ergashev, B ^a   Ferekides, C S ^c   Hubbimov, A ^a   Ikramov, B ^a   Kouchkarov, K M ^a   Mathew, X ^d   Morel, D ^c   Ostapenko, S ^c   Sanchez Meza, E ^b   Stefanakos, E ^c   Upadhyaya, H M ^e   Vigil Galan, O ^b   Vorobiev, Yu V ^f  

^a S YU YUNUSOV INSTITUTE OF THE CHEMISTRY OF PLANT SUBSTANCES   (Uzbekistan)

^b INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^c UNIVERSITY OF SOUTH FLORIDA   (United States)

^d INSTITUTO DE ENERGÍAS RENOVABLES   (Mexico)

^e LOUGHBOROUGH UNIVERSITY   (United Kingdom)

^f DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

CdTe; Chemical molecular beam deposition; Photoluminescence; Resistivity; Thin film

Indexed keywords

ATMOSPHERIC COMPOSITION; ATMOSPHERIC PRESSURE; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CHEMICAL ANALYSIS; CHEMICAL MODIFICATION; CHEMICAL PROPERTIES; ELECTRIC PROPERTIES; FABRICATION; HYDROGEN; LIGHT EMISSION; LUMINESCENCE; MOLECULAR BEAMS; MOLECULAR DYNAMICS; PHOTOLUMINESCENCE; SEMICONDUCTING CADMIUM TELLURIDE; SILICON COMPOUNDS; TELLURIUM COMPOUNDS; THICK FILMS;

CDTE; CHEMICAL MOLECULAR BEAM DEPOSITION; CHEMICAL MOLECULAR BEAM DEPOSITIONS; ELECTRICAL PROPERTIES; HYDROGEN FLOWS; LOW COSTS; RESISTIVITY;

CADMIUM;

ATMOSPHERIC PRESSURE; CERAMICS; ELECTRICAL RESISTIVITY; SCANNING ELECTRON MICROSCOPY; SUBSTRATE; X-RAY DIFFRACTION;

EID: 57049186341     PISSN: 0038092X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solener.2008.07.003     Document Type: Article

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