Effect of film thickness on microstructure parameters and optical constants of CdTe thin films

Journal of Alloys and Compounds

Volumn 482, Issue 1-2, 2009, Pages 400-404

  Shaaban, E R ^a,c   Afify, N ^b   El Taher, A ^a,c  

^a QASSIM UNIVERSITY   (Saudi Arabia)

^b Assiut University   (Egypt)

^c Assiut Branch   (Egypt)

Author keywords

CdTe; Microstructure parameters; Optical constants; Semiconductors; Thin films

Indexed keywords

ABSORPTION REGION; BAND GAPS; CADMIUM TELLURIDE; CAUCHY DISPERSION; CDTE; DIFFERENT THICKNESS; DIRECT TRANSITION; ENVELOPE METHOD; EXPERIMENTAL ERRORS; EXTINCTION COEFFICIENTS; GLASS SUBSTRATES; MICRO-STRAIN; MICROSTRUCTURE PARAMETERS; OPTICAL PARAMETER; POLYCRYSTALLINE; REFLECTANCE SPECTRUM; SEMICONDUCTORS; SPECTRAL RANGE; STRUCTURAL CHARACTERISTICS; THERMAL EVAPORATION TECHNIQUE; XRD; ZINC-BLENDE;

ABSORPTION SPECTROSCOPY; CADMIUM; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CRYSTALLITE SIZE; ENERGY GAP; FILM THICKNESS; LIGHT REFRACTION; MAGNETIC FILMS; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; OPTICAL CONSTANTS; ORGANIC POLYMERS; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING CADMIUM TELLURIDE; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC;

OPTICAL FILMS;

EID: 67349168116     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.04.033     Document Type: Article

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