Studies of resistance switching effects in metal/YBa 2 Cu 3 O 7-x interface junctions

Applied Surface Science

Volumn 256, Issue 18, 2010, Pages 5684-5687

  Plecenik, A ^a   Tomasek, M ^a   Plecenik, T ^a   Truchly, M ^a   Noskovic, J ^a   Zahoran, M ^a   Roch, T ^a   Belogolovskii, M ^b   Spankova, M ^c   Chromik, S ^c   Kus, P ^a  

^a Physics and Informatics   (Slovakia)

^b DONETSK PHYSICOTECHNICAL INSTITUTE   (Ukraine)

^c INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

Author keywords

Planar junction; Resistive switching effect; STM; Superconductivity

Indexed keywords

BARIUM COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; HYSTERESIS; INTERFACES (MATERIALS); IRIDIUM COMPOUNDS; NANOTECHNOLOGY; OXYGEN VACANCIES; PLATINUM COMPOUNDS; POINT CONTACTS; SUPERCONDUCTIVITY; TEMPERATURE DISTRIBUTION; THIN FILMS; VOLTAGE MEASUREMENT; YTTRIUM BARIUM COPPER OXIDES;

HYSTERETIC BEHAVIOR; JUNCTION INTERFACES; JUNCTION RESISTANCES; PLANAR JUNCTIONS; RESISTANCE SWITCHING EFFECT; RESISTIVE SWITCHING; TEMPERATURE DEPENDENCE; YBA2CU3O7-X THIN FILM;

COPPER COMPOUNDS;

EID: 77953233558     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.03.018     Document Type: Article

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