Resistive switching and data reliability of epitaxial (Ba,Sr) Ti O3 thin films

Applied Physics Letters

Volumn 88, Issue 4, 2006, Pages 1-3

  Oligschlaeger, R ^a   Waser, R ^a   Meyer, R ^b   Karthauser S ^b   Dittmann, R ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b CNI   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; EPITAXIAL GROWTH; HYSTERESIS; SWITCHING;

DATA RETENTION; RESISTIVE SWITCHING; VOLTAGE PULSES;

THIN FILMS;

EID: 31544471853     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2162860     Document Type: Article

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