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Volumn 55, Issue 18, 2010, Pages 5210-5222
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Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy
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Author keywords
Debye screening; EDL overlap; Electric double layer; Scanning probe microscopy; SECPM
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Indexed keywords
CHARGED SURFACES;
COMPUTATIONAL MODELING;
DEBYE SCREENING;
DILUTE SOLUTION;
EDL OVERLAP;
ELECTRIC DOUBLE LAYER;
ELECTROCHEMICAL POTENTIAL;
ELECTROLYTE SOLUTIONS;
ION SIZE;
IONIC DISTRIBUTION;
NUMERICAL SIMULATION;
OPEN CIRCUIT POTENTIAL;
POISSON-BOLTZMANN EQUATIONS;
POTENTIAL PROFILES;
STERIC EFFECT;
BOLTZMANN EQUATION;
CHARGED PARTICLES;
COMPUTER SIMULATION;
ELECTROCHEMISTRY;
ELECTROLYTES;
POISSON EQUATION;
SCANNING;
SCANNING PROBE MICROSCOPY;
PROBES;
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EID: 77953132413
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2010.04.042 Document Type: Article |
Times cited : (15)
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References (70)
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