Direct probing of electrical double layers by scanning electrochemical potential microscopy

Journal of Physical Chemistry C

Volumn 111, Issue 12, 2007, Pages 4620-4627

  Hurth, Cedric ^a   Li, Chunzeng ^b   Bard, Allen J ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b VEECO INSTRUMENTS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL DOUBLE LAYERS; NANOELECTRODES; REDOX MEDIATORS; SCANNING ELECTROCHEMICAL POTENTIAL MICROSCOPY (SECPM);

ELECTROCHEMICAL ELECTRODES; METAL FOIL; PLATINUM; POLYETHYLENES; REDOX REACTIONS; SCANNING PROBE MICROSCOPY;

ELECTRIC INSULATORS;

EID: 34147191002     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp0661084     Document Type: Article

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