Atomic structure of amorphous and crystallized Ge15 Sb 85

Journal of Applied Physics

Volumn 107, Issue 10, 2010, Pages

  Zalden, Peter ^a   Bichara, Christophe ^b   Van Eijk, Julia ^a   Braun, Carolin ^c   Bensch, Wolfgang ^c   Wuttig, Matthias ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c UNIVERSITY OF KIEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; AMORPHOUS PHASE; AMORPHOUS SAMPLES; ANNEALING CONDITION; ATOMIC STRUCTURE; COHERENCE LENGTHS; CONCENTRATION OF; EXAFS; EXPERIMENTAL TECHNIQUES; EXTENDED X-RAY ABSORPTION FINE STRUCTURE MEASUREMENTS; GE ATOM; LOCAL ORDER; LONG RANGE ORDERS; NEAREST NEIGHBORS; PROMISING MATERIALS; TWO PHASIS; X-RADIATION; XRD;

ABSORPTION; AGGLOMERATION; ATOMS; BOND LENGTH; PHASE CHANGE MEMORY; PHASE MODULATION; PHASE SEPARATION; TELLURIUM COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

GERMANIUM;

EID: 77952992580     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3380667     Document Type: Article

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