Calorimetric measurements of structural relaxation and glass transition temperatures in sputtered films of amorphous Te alloys used for phase change recording

Journal of Materials Research

Volumn 22, Issue 3, 2007, Pages 748-754

  Kalb, J A ^a,b,c   Wuttig, M ^a   Spaepen, F ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b HARVARD UNIVERSITY   (United States)

^c Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANNEALING; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; GLASS TRANSITION; STRUCTURAL RELAXATION; TELLURIUM; THERMAL GRADIENTS;

AMORPHOUS PHASE; PREANNEALING; TELLURIUM ALLOY;

THIN FILMS;

EID: 33947200124     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2007.0103     Document Type: Article

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