Molecular liquid under nanometre confinement: Density profiles underlying oscillatory forces

Journal of Physics Condensed Matter

Volumn 22, Issue 23, 2010, Pages

  Perret, Edith ^a   Nygård, Kim ^a   Satapathy, Dillip K ^b   Balmer, Tobias E ^c   Bunk, Oliver ^a   Heuberger, Manfred ^d   Friso Van Der Veen, J ^a,c  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF FRIBOURG   (Switzerland)

^c ETH ZURICH   (Switzerland)

^d SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY PROFILE; DISCRETE STEP; ELECTRON DENSITIES; FORCE PROFILE; IN-PLANE; LAYER SPACINGS; LAYERING TRANSITIONS; MOLECULAR DIAMETER; MOLECULAR LIQUIDS; NANOMETRES; NORMAL FORCES; OPTICAL INTERFEROMETRY; STEP SIZE; TETRAKIS; TRIMETHYL; ULTRA-THIN; X RAY REFLECTIVITY;

LIQUIDS; MAGNETIC FILMS; MICA; SILICATE MINERALS; X RAY DIFFRACTION;

ULTRATHIN FILMS;

ALUMINUM SILICATE; MICA; ORGANOSILICON DERIVATIVE; SILANE DERIVATIVE;

ARTICLE; CHEMISTRY; EQUIPMENT DESIGN; INTERFEROMETRY; MATERIALS TESTING; METHODOLOGY; NORMAL DISTRIBUTION; OSCILLOMETRY; SURFACE PROPERTY; SYNCHROTRON; X RAY;

ALUMINUM SILICATES; EQUIPMENT DESIGN; INTERFEROMETRY; MATERIALS TESTING; NORMAL DISTRIBUTION; ORGANOSILICON COMPOUNDS; OSCILLOMETRY; SILANES; SURFACE PROPERTIES; SYNCHROTRONS; X-RAYS;

EID: 77952865635     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/23/235102     Document Type: Article

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