Structure of confined fluids by x-ray interferometry using diffraction gratings

Optics Express

Volumn 16, Issue 25, 2008, Pages 20522-20529

  Nygard K ^a   Satapathy, D K ^a   Bunk, O ^a   Diaz, A ^b   Perret, E ^a   Buitenhuis, J ^c   Pfeiffer, F ^a,d   David, C ^a   Van Der Veen, J F ^a,e  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

^d EPFL   (Switzerland)

^e ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; INTERFEROMETRY; WAVE INTERFERENCE;

DENSITY MODULATION; DENSITY PROFILE; ENSEMBLE-AVERAGED; FOURIER INVERSION; MICROFLUIDIC ARRAY; STRUCTURE DETERMINATION; WEAK PHASE OBJECT; X-RAY INTERFEROMETRY;

DIFFRACTION GRATINGS;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; DRUG MIXTURE; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; INTERFEROMETRY; LIGHT; MICROFLUIDICS; RADIATION SCATTERING; REFRACTOMETRY; THEORETICAL MODEL; X RAY DIFFRACTION;

COMPLEX MIXTURES; COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; LIGHT; MICROFLUIDICS; MODELS, THEORETICAL; REFRACTOMETRY; SCATTERING, RADIATION; X-RAY DIFFRACTION;

EID: 57349097766     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.020522     Document Type: Article

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17. 0 = 0.
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