The x-ray surface forces apparatus for simultaneous x-ray diffraction and direct normal and lateral force measurements

Review of Scientific Instruments

Volumn 73, Issue 6, 2002, Pages 2486-

  Golan, Yuval ^a,b   Seitz, Markus ^a   Luo, Ci ^a   Martin Herranz, Ana ^c   Yasa, Mario ^c   Li, Youli ^c   Safinya, Cyrus R ^c   Israelachvili, Jacob ^a  

^a University of California   (United States)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036609418     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1480461     Document Type: Article

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