Colloidal monolayer trapped near a charged wall: A synchrotron X-ray diffraction study

Physical Review Letters

Volumn 101, Issue 13, 2008, Pages

  Satapathy, D K ^a   Bunk, O ^a   Jefimovs, K ^a   Nygard K ^a   Guo, H ^b   Diaz, A ^a   Perret, E ^a   Pfeiffer, F ^a,c   David, C ^a   Wegdam, G H ^b   Van Der Veen, J F ^a,d  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

^c EPFL   (Switzerland)

^d ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOID CHEMISTRY; COLLOIDS; CONCENTRATION (PROCESS); DIFFRACTION; ELECTRON ENERGY LEVELS; SILICA; WALLS (STRUCTURAL PARTITIONS); X RAY ANALYSIS; X RAY DIFFRACTION;

CENTRAL REGION; CHARGE-STABILIZED; CONCENTRATION PROFILES; COULOMB-INTERACTIONS; DIELECTRIC WALLS; MICRO-FLUIDIC CHANNELS; NANOMETER DISTANCE; SALT IONS; SILICA COLLOIDS; SYNCHROTRON X-RAY DIFFRACTION;

IONIC STRENGTH;

EID: 53349109143     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.101.136103     Document Type: Article

References (20)

1. J.N. Israelachvili, Intermolecular and Surface Forces (Academic, New York, 1991), 2nd ed.
2. D.G. Grier and Y. Han, J. Phys. Condens. Matter 16, S4145 (2004). JCOMEL 0953-8984 10.1088/0953-8984/16/38/028
3. P. González-Mozuelos and M. Medina-Noyola, J. Chem. Phys. 94, 1480 (1991). JCPSA6 0021-9606 10.1063/1.460007
4. P. González-Mozuelos and M. Medina-Noyola, J. Chem. Phys. 93, 2109 (1990). JCPSA6 0021-9606 10.1063/1.459036
5. H.H. von Grünberg and E.C. Mbamala, J. Phys. Condens. Matter 13, 4801 (2001). JCOMEL 0953-8984 10.1088/0953-8984/13/21/311
6. D. Goulding and J.-P. Hansen, Europhys. Lett. EULEEJ 0295-5075 46, 407 (1999). 10.1209/epl/i1999-00276-4
7. A.D. Trokhymchuck, D. Henderson, D.T. Wasan, and A. Nikolov, Ionic Soft Matter: Modern Trends in Theory and Applications (Springer, New York, 2005).
8. J. Chakrabarti and H. Löwen, Phys. Rev. E 58, 3400 (1998). PLEEE8 1063-651X 10.1103/PhysRevE.58.3400
9. E. Allahyarov, I. D'Amico, and H. Löwen, Phys. Rev. E 60, 3199 (1999). PLEEE8 1063-651X 10.1103/PhysRevE.60.3199
10. M. Polin, D.G. Grier, and Y. Han, Phys. Rev. E 76, 041406 (2007). PLEEE8 1063-651X 10.1103/PhysRevE.76.041406
11. A. Diaz, C. David, H. Guo, H. Keymeulen, F. Pfeiffer, G. Wegdam, T. Weitkamp, and J.F. van der Veen, Physica (Amsterdam) PHYBE3 0921-4526 357B, 199 (2005). 10.1016/j.physb.2004.11.056
12. A. Diaz and J.F. van der Veen, Thin Solid Films 515, 5645 (2007). THSFAP 0040-6090 10.1016/j.tsf.2006.12.117
13. O. Bunk, A. Diaz, F. Pfeiffer, C. David, D.K. Satapathy, and J.F. van der Veen, Acta Crystallogr. Sect. A ACACEQ 0108-7673 63, 306 (2007). 10.1107/S0108767307021903
14. D.O. Riese, Ph.D. thesis, University of Amsterdam, 2000.
15. M. Raşa and A.P. Philipse, Nature (London) 429, 857 (2004). NATUAS 0028-0836 10.1038/nature02672
16. K. Nygård (to be published).
17. K. Nygård, D.K. Satapathy, O. Bunk, F. Pfeiffer, C. David, and J.F. van der Veen, Appl. Phys. Lett. 92, 214105 (2008). APPLAB 0003-6951 10.1063/1.2938050
18. O. Bunk, Phys. Rev. E 75, 021501 (2007). PLEEE8 1063-651X 10.1103/PhysRevE.75.021501
19. P. Linse, J. Phys. Condens. Matter 14, 13449 (2002). JCOMEL 0953-8984 10.1088/0953-8984/14/49/304
20. J.J. Liétor-Santos, M. Chávez-Páez, M. Márquez, A. Fernández-Nieves, and M. Medina-Noyola, Phys. Rev. E 76, 050403 (2007). PLEEE8 1063-651X 10.1103/PhysRevE.76.050403