Ellipsometric study of single-crystal γ-InSe from 1.5 to 9.2 eV

Applied Physics Letters

Volumn 96, Issue 18, 2010, Pages

  Choi, S G ^a   Aspnes, D E ^b   Fuchser, A L ^c   Martinez Tomas, C ^d   Sanjoś, V Muoz ^d   Levi, D H ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c J A WOOLLAM CO INC   (United States)

^d UNIVERSITY OF VALENCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINED METHOD; CRITICAL POINTS; FRESH SURFACES; ROOM TEMPERATURE; SPECTRAL ANALYSIS; VACUUM ULTRAVIOLET SPECTROSCOPIC ELLIPSOMETRY;

SPECTROSCOPIC ELLIPSOMETRY; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS;

ULTRAVIOLET SPECTROSCOPY;

EID: 77952790815     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3420080     Document Type: Article

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