Pseudodielectric functions of uniaxial materials in certain symmetry directions

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 23, Issue 2, 2006, Pages 468-475

  Jellison Jr , G E ^a   Baba, J S ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BIREFRINGENCE; CRYSTAL SYMMETRY; LIGHT POLARIZATION; REFLECTION; SINGLE CRYSTALS;

CROSS-POLARIZATION; OPTIC AXIS; PLANE OF INCIDENCE; PSEUDODIELECTRIC FUNCTIONS; UNIAXIAL CRYSTALS; UNIAXIAL MATERIALS;

ELLIPSOMETRY;

EID: 33644519298     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.23.000468     Document Type: Article

References (14)

1. D. E. Aspnes, "Approximate solution of ellipsometric equations for optically biaxial crystals," J. Opt. Soc. Am. 70, 1275-1277 (1980).
2. V. V. Filippov, A. Yu. Tronin, and A. F. Konstantinova, "Ellipsometry of anisotropic media," Crystallogr. Rep. 39, 313-335 (1994).
3. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).
4. J. Lekner, "Reflection ellipsometry of uniaxial crystals," J. Opt. Soc. Am. A 14, 1359-1362 (1997).
5. J. Lekner, "Reflection and refraction by uniaxial crystals," J. Phys.: Condens. Matter 3, 6121-6133 (1991).
6. G. E. Jellison, Jr., F. A. Modine, and L. A. Boatner, "Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO2)," Opt. Lett. 22, 1808-1810 (1997).
7. G. E. Jellison, Jr., L. A. Boatner, J. D. Budai, B. S. Jeong, and D. P. Norton, "Spectroscopic ellipsometry of thin film and bulk anatase (TiO2)," J. Appl. Phys. 93, 9537-9541 (2003).
8. M. Schubert, B. Rheinlander, J. A. Woollam, B. Johs, and C. M. Herzinger, "Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO2," J. Opt. Soc. Am. A 13, 875-883 (1996).
9. T. E. Tiwald and M. Schubert, "Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 μm using generalized ellipsometry," in Proc. SPIE 4103, 19-29 (2000).
10. G. E. Jellison, Jr., and F. A. Modine, "Two-modulator generalized ellipsometry: experiment and calibration," Appl. Opt. 36, 8184-8189 (1997).
11. G. E. Jellison, Jr., and F. A. Modine, "Two-modulator generalized ellipsometry: theory," Appl. Opt. 36, 8190-8198 (1997).
12. G. E. Jellison, Jr., "Spectroscopic ellipsometry data analysis: measured versus calculated quantities," Thin Solid Films 313-314, 33-39 (1998).
13. G. E. Jellison, Jr., "Data analysis for spectroscopic ellipsometry," Thin Solid Films 234, 416-422 (1993).
14. D. A. G. Bruggeman, "Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen," Ann. Phys. (Leipzig) 24, 636-679 (1935).