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Volumn 205, Issue 4, 2008, Pages 884-887
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Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL POINTS;
PSEUDODIELECTRIC FUNCTIONS;
ROOM TEMPERATURES;
THEORETICAL CALCULATIONS;
DIELECTRIC PROPERTIES;
EQUATIONS OF STATE;
INDIUM ARSENIDE;
SPECTROSCOPIC ELLIPSOMETRY;
THICK FILMS;
THIN FILMS;
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EID: 54849422680
PISSN: 18626300
EISSN: 18626319
Source Type: Journal
DOI: 10.1002/pssa.200777848 Document Type: Article |
Times cited : (5)
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References (14)
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