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Volumn 1181, Issue , 2010, Pages 135-140
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Sputtering yield measurements with size-selected gas cluster ion beams
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Author keywords
[No Author keywords available]
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Indexed keywords
CLUSTER ION BEAMS;
CLUSTER IONS;
CLUSTER SIZES;
CLUSTER-SIZE DISTRIBUTION;
GAS CLUSTER ION BEAMS;
INCIDENT ENERGY;
IRRADIATION DOSE;
SI SUBSTRATES;
SIZE RANGES;
SPUTTERING YIELDS;
TIME-OF-FLIGHT METHOD;
ION BEAMS;
IONS;
SPUTTERING;
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EID: 77952412923
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (12)
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