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Volumn 202, Issue , 2003, Pages 278-282
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Molecular dynamics study of damage formation characteristics by large cluster ion impacts
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Author keywords
Cluster impact; Damage formation; Molecular dynamics
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Indexed keywords
ARGON;
ION BEAMS;
SILICON;
SURFACE TREATMENT;
THIN FILMS;
CLUSTER IMPACT;
MOLECULAR DYNAMICS;
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EID: 0037377295
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01869-4 Document Type: Conference Paper |
Times cited : (49)
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References (9)
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