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Volumn 202, Issue , 2003, Pages 278-282

Molecular dynamics study of damage formation characteristics by large cluster ion impacts

Author keywords

Cluster impact; Damage formation; Molecular dynamics

Indexed keywords

ARGON; ION BEAMS; SILICON; SURFACE TREATMENT; THIN FILMS;

EID: 0037377295     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01869-4     Document Type: Conference Paper
Times cited : (49)

References (9)
  • 9
    • 0012473277 scopus 로고    scopus 로고
    • Proceedings of 16th international conference on the application of accelerators in research and industry
    • Seki T., Matsuo J., Takaoka G.H., Yamada I. Proceedings of 16th international conference on the application of accelerators in research and industry. AIP Conference Proceedings. Vol. 576:2001;1003.
    • (2001) AIP Conference Proceedings , vol.576 , pp. 1003
    • Seki, T.1    Matsuo, J.2    Takaoka, G.H.3    Yamada, I.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.