Compressed sensing for surface characterization and metrology

IEEE Transactions on Instrumentation and Measurement

Volumn 59, Issue 6, 2010, Pages 1600-1615

  Ma, Jianwei ^a,b  

^a TSINGHUA UNIVERSITY   (China)

^b CENTRE DE GÉOSCIENCES   (France)

Author keywords

Compressed sensing (CS) compressive sampling; Curvelets; Incomplete measurement; Sparse recovery; Surface characterization; Surface metrology; Wave atoms

Indexed keywords

COMPRESSED SENSING; COMPRESSIVE SAMPLING; CURVELETS; INCOMPLETE MEASUREMENTS; SPARSE RECOVERY; SURFACE CHARACTERIZATION; SURFACE METROLOGY;

ATOMS; RECOVERY; SIGNAL RECONSTRUCTION; SURFACE MEASUREMENT; SURFACE PROPERTIES;

MEASUREMENTS;

EID: 77952293052     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2009.2027744     Document Type: Article

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