Combined complex ridgelet shrinkage and total variation minimization

SIAM Journal on Scientific Computing

Volumn 28, Issue 3, 2006, Pages 984-1000

  Ma, Jianwei ^a,b   Fenn, Markus ^c  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIV GRENOBLE ALPES   (France)

^c UNIVERSITY OF MANNHEIM   (Germany)

Author keywords

Complex wavelets; Detection of line singularities; Nonequispaced fast Fourier transform; Ridgelets; Shift invariance; Surface characterization; Total variation minimization

Indexed keywords

FOURIER TRANSFORMS; INTERPOLATION; INVERSE PROBLEMS; NUMERICAL METHODS; WAVELET TRANSFORMS;

COMPLEX WAVELETS; DETECTION OF LINE SINGULARITIES; NONEQUISPACED FAST FOURIER TRANSFORM; RIDGELETS; SHIFT INVARIANCE; SURFACE CHARACTERIZATION; TOTAL VARIATION MINIMIZATION;

SURFACE TOPOGRAPHY;

EID: 33846962921     PISSN: 10648275     EISSN: None     Source Type: Journal    
DOI: 10.1137/05062737X     Document Type: Article

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