Towards artifact-free characterization of surface topography using complex wavelets and total variation minimization

Applied Mathematics and Computation

Volumn 170, Issue 2, 2005, Pages 1014-1030

  Ma, Jianwei ^a,b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF HUDDERSFIELD   (United Kingdom)

Author keywords

Complex wavelet transform; Denoising; Feature extraction; Surface characterization; Total variation

Indexed keywords

APPROXIMATION THEORY; BIOMEDICAL ENGINEERING; FEATURE EXTRACTION; NUMERICAL ANALYSIS; WAVELET TRANSFORMS;

COMPLEX WAVELET TRANSFORM; DENOISING; SURFACE CHARACTERIZATION; TOTAL VARIATION;

SURFACE TOPOGRAPHY;

EID: 27144435141     PISSN: 00963003     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.amc.2004.12.053     Document Type: Article

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