Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 53, Issue , 2010, Pages 186-187

  Meterelliyoz, Mesut ^a   Goel, Ashish ^b   Kulkarni, Jaydeep P ^a   Roy, Kaushik ^b  

^a INTEL CORPORATION   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS CIRCUITS; CALIBRATION CIRCUITS; CURRENT MEASUREMENTS; DATA ANALYSIS; DEVICES UNDER TESTS; FAST MEASUREMENT; HIGH SENSITIVITY; HIGH-SENSITIVITY SENSOR; IN-PROCESS; LIMITED SENSITIVITY; LOW VOLTAGES; LOW-VOLTAGE; MEASUREMENT METHODS; ON CHIPS; RANDOM THRESHOLD; ROBUST OPERATION; SENSE AMPLIFIER; STATISTICAL DATAS; SUBTHRESHOLD; YIELD LEARNING;

CALIBRATION; DIFFERENTIAL AMPLIFIERS; ELECTRIC CURRENT MEASUREMENT; ELECTRONIC EQUIPMENT TESTING; OPTIMIZATION; RANDOM PROCESSES; SENSORS; STATIC RANDOM ACCESS STORAGE; THRESHOLD VOLTAGE;

SENSITIVITY ANALYSIS;

EID: 77952209102     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2010.5433991     Document Type: Conference Paper

References (7)

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