Fabrication and orientation dependence on electrical properties of Na 0.5Bi4.5Ti4O15 thin films

Integrated Ferroelectrics

Volumn 107, Issue 1, 2009, Pages 112-120

  Kim, J W ^a   Do, D ^a   Kim, S S ^a   Lee, Y I ^a   Song, T K ^a   Choi, B C ^b   Bhalla, A S ^c  

^a Changwon National University   (South Korea)

^b Pukyong National University   (South Korea)

^c The University of Texas at San Antonio   (United States)

Author keywords

Chemical solution deposition; Electrical properties; Na0.5Bi4.5Ti4O15 thin film

Indexed keywords

CHEMICAL SOLUTION DEPOSITION; CHEMICAL SOLUTION DEPOSITION METHOD; CRYSTALLOGRAPHIC ORIENTATIONS; DIELECTRIC CONSTANTS; ELECTRICAL PROPERTIES; ELECTRICAL PROPERTY; ORIENTATION DEPENDENCE; ORIENTED THIN FILMS; OXYGEN ATMOSPHERE; POLARIZATION FATIGUE; PREFERRED ORIENTATIONS; PT(111); RANDOM ORIENTATIONS; REMNANT POLARIZATIONS; SCANNING ELECTRON MICROSCOPE; SI (100) SUBSTRATE; SWITCHING CYCLES;

CHEMICALS; FERROELECTRIC FILMS; FERROELECTRICITY; OXYGEN; PLATINUM; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SODIUM; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

ELECTRIC PROPERTIES;

EID: 77952194111     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/10584580903325011     Document Type: Conference Paper

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