Sintering process and annealing effect on some physical properties of V2O5 thin films

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 3, Issue 7, 2009, Pages 693-699

  Mohamed, H A ^a,b  

^a Sohag University   (Egypt)

^b KING SAUD UNIVERSITY   (Saudi Arabia)

Author keywords

Electrical resistivity; Sintering; Thin films; V2O5

Indexed keywords

ANNEALING; ELECTRIC CONDUCTIVITY; MORPHOLOGY; SINTERING; SUBSTRATES; VANADIUM PENTOXIDE;

ANNEALING EFFECTS; ANNEALING TEMPERATURES; AS-DEPOSITED FILMS; E BEAM EVAPORATION; HIGH TRANSMITTANCE; OPTOELECTRONIC PROPERTIES; SINTERING PROCESS; V2O5;

THIN FILMS;

EID: 77951989892     PISSN: 18426573     EISSN: 20653824     Source Type: Journal    
DOI: None     Document Type: Article

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