Influence of oxygen partial pressure on the optical properties of electron beam evaporated vanadium pentoxide thin films

Optical Materials

Volumn 10, Issue 2, 1998, Pages 101-107

  Ramana, C V ^a   Hussain, O M ^a   Uthanna, S ^a   Naidu, B Srinivasulu ^a  

^a SRI VENKATESWARA UNIVERSITY   (India)

Author keywords

Electron beam evaporation; Structure and optical properties; Vanadium pentoxide thin films

Indexed keywords

DEPOSITION; ELECTRON BEAMS; OXYGEN; PRESSURE EFFECTS; STRUCTURE (COMPOSITION); THIN FILMS; VANADIUM COMPOUNDS;

ELECTRON BEAM EVAPORATION; OPTICAL BAND GAP; OXYGEN PARTIAL PRESSURE; VANADIUM PENTOXIDE THIN FILM;

OPTICAL PROPERTIES;

EID: 0032074789     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(97)00168-7     Document Type: Article

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