Synthesis and structural characterization of mesoporous V2O5 thin films for electrochromic applications

Thin Solid Films

Volumn 515, Issue 4, 2006, Pages 1500-1505

  Cremonesi, A ^a   Bersani, D ^a   Lottici, P P ^a   Djaoued, Y ^b   Bruning R ^c  

^a UNIVERSITY OF PARMA   (Italy)

^b UNIVERSITÉ DE MONCTON   (Canada)

^c MOUNT ALLISON UNIVERSITY   (Canada)

Author keywords

Micro Raman spectroscopy; Scanning electron microscopy; Vanadium oxide; X ray diffraction

Indexed keywords

ELECTROCHROMISM; HYDROLYSIS; MESOPOROUS MATERIALS; POLYETHYLENE GLYCOLS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; VANADIUM COMPOUNDS; X RAY DIFFRACTION;

DIRECTING AGENTS; MICROMETRIC CLUSTERS; POROUS NETWORKS; VANADIUM OXIDES;

THIN FILMS;

EID: 33751231729     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.04.029     Document Type: Article

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