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Volumn 12, Issue 9, 2010, Pages 2124-2127

Bis-anthracene fused porphyrins: Synthesis, crystal structure, and near-IR absorption

Author keywords

[No Author keywords available]

Indexed keywords

ANTHRACENE; ANTHRACENE DERIVATIVE; PORPHYRIN;

EID: 77951780269     PISSN: 15237060     EISSN: 15237052     Source Type: Journal    
DOI: 10.1021/ol100619p     Document Type: Article
Times cited : (149)

References (36)
  • 27
    • 84983681648 scopus 로고
    • X-ray diffraction data for crystals of Ni-1b were collected at 150 K (;) with synchrotron radiation using I19 (EH1) at the Diamond Light Source. Data were collected and reduced using CrystalClear (Rigaku Inc., 2009)
    • X-ray diffraction data for crystals of Ni-1b were collected at 150 K (Cosier, J.; Glazer, A. M. J. Appl. Crystallogr. 1986, 19, 105-107) with synchrotron radiation using I19 (EH1) at the Diamond Light Source. Data were collected and reduced using CrystalClear (Rigaku Inc., 2009)
    • (1986) J. Appl. Crystallogr. , vol.19 , pp. 105-107
    • Cosier, J.1    Glazer, A.M.2
  • 30
    • 0001792356 scopus 로고    scopus 로고
    • The structure contains large solvent accessible voids comprising weak, diffuse electron density. The discrete Fourier transforms of the void regions were treated as contributions to the A and B parts of the calculated structure factors using PLATON/SQUEEZE,-13
    • The structure contains large solvent accessible voids comprising weak, diffuse electron density. The discrete Fourier transforms of the void regions were treated as contributions to the A and B parts of the calculated structure factors using PLATON/SQUEEZE (Spek, A. J. Appl. Crystallogr. 2003, 36, 7-13
    • (2003) J. Appl. Crystallogr. , vol.36 , pp. 7
    • Spek, A.1
  • 31
    • 84942435207 scopus 로고
    • integrated with the CRYSTALS software
    • van der Sluis, P.; Spek, A. L. Acta Crystallogr. 1990, A46, 194-201) integrated with the CRYSTALS software
    • (1990) Acta Crystallogr. , vol.46 , pp. 194-201
    • Van Der Sluis, P.1    Spek, A.L.2
  • 32
    • 77951840208 scopus 로고    scopus 로고
    • The sample consisted of very thin plates which were highly prone to solvent loss, leading to very weak data with high agreement factors and the requirement for copious restraints. Full refinement details are given in the SI and the CIF file. Crystallographic data (excluding structure factors) have been deposited with the Cambridge Crystallographic Data Centre (CCDC 771217), and copies of these data can be obtained free of charge via
    • The sample consisted of very thin plates which were highly prone to solvent loss, leading to very weak data with high agreement factors and the requirement for copious restraints. Full refinement details are given in the SI and the CIF file. Crystallographic data (excluding structure factors) have been deposited with the Cambridge Crystallographic Data Centre (CCDC 771217), and copies of these data can be obtained free of charge via www. ccdc.cam.ac.uk/data-request/cif.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.