True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

Macromolecules

Volumn 43, Issue 7, 2010, Pages 3169-3172

  Wang, Dong ^a   Fujinami, So ^a   Nakajima, Ken ^a   Nishi, Toshio ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER DEFLECTION; CONSTANT FORCE; FOURIER; MAPPING DATA; QUANTITATIVE METHOD; SAMPLE DEFORMATION; SPECIFIC VALUES; SPRING CONSTANTS; TAPPING MODES; TRIBLOCK COPOLYMERS;

ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; BUTENES; COPOLYMERIZATION; ETHYLENE; NANOCANTILEVERS; SCANNING; STYRENE; TWO DIMENSIONAL;

SURFACE TOPOGRAPHY;

EID: 77951544521     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma9028695     Document Type: Article

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