Nanomechanical mapping of carbon black reinforced natural rubber by atomic force microscopy

Chinese Journal of Polymer Science (English Edition)

Volumn 25, Issue 1, 2007, Pages 35-41

  Nishi, Toshio ^a   Nukaga, Hideyuki ^a   Fujinami, So ^a   Nakajima, Ken ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

AFM; Carbon black; Force distance curve; Natural rubber; Young's modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON BLACK; ELASTIC MODULI; NUCLEAR MAGNETIC RESONANCE; SURFACE CHEMISTRY; SURFACE TOPOGRAPHY;

CARBON BLACK REINFORCED NATURAL RUBBER; CONTACT MECHANICS; FORCE DISTANCE CURVES;

RUBBER;

EID: 34248151383     PISSN: 02567679     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0256767907001820     Document Type: Conference Paper

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