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Volumn 31, Issue 5, 2010, Pages 467-477

Total reflection X-ray fluorescence (TXRF) for direct analysis of aerosol particle samples

Author keywords

Air particulate matters; Direct analysis; Heavy metals; Nanomaterials; TXRF

Indexed keywords

ATMOSPHERIC CHEMISTRY; ATMOSPHERIC COMPOSITION; ATMOSPHERIC THERMODYNAMICS; CADMIUM; CHEMICAL ELEMENTS; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; HEALTH; HEALTH RISKS; LEACHING; LEAD; METAL ANALYSIS; NANOSTRUCTURED MATERIALS; X RAY ANALYSIS; X RAY DIFFRACTION;

EID: 77951195171     PISSN: 09593330     EISSN: 1479487X     Source Type: Journal    
DOI: 10.1080/09593330903513260     Document Type: Article
Times cited : (24)

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